Abnormality detection apparatus, abnormality detection method, and non-transitory computer readable medium
US10496515B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2017 |
| Grant date | Dec 3, 2019 |
| Priority date | — |
| Expiry date | Dec 30, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An apparatus according to one embodiment of the present invention detects an abnormality of a monitoring target on the basis of state data of the target and includes an estimated data calculator, a deviation degree calculator, an abnormality degree calculator, and an abnormality determiner. The estimated data calculator calculates estimated data of a second period on the basis of the state data of the first period. The deviation degree calculator calculates a degree of deviation of the second period on the basis of the state data and the estimated data of the second period. The abnormality degree calculator calculates a degree of abnormality of the second period on the basis of the degree of deviation of the second period. The abnormality determiner determines presence or absence of an abnormality of the target in the second period on the basis of the degree of abnormality in the second period.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.