System and method for enhanced characterization for system identification of non-linear systems
US10496767B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 5, 2016 |
| Grant date | Dec 3, 2019 |
| Priority date | — |
| Expiry date | Jan 26, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/398
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure relates to non-linear systems associated with an electronic circuit design. Embodiments may include identifying the non-linear system associated with the electronic circuit design and determining a degree of severity of non-linearity of the non-linear system associated with the electronic circuit design. If the degree of severity is less than a predefined threshold, embodiments may further include receiving a random input pattern and deriving a single impulse response characterization, wherein the random input pattern is based upon, at least in part, an electronic circuit simulation associated with the electronic circuit design.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.