Metrology system for positioning assemblies
US10501209B2 · kind B2 · utility
2Cited by
64References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 19, 2018 |
| Grant date | Dec 10, 2019 |
| Priority date | — |
| Expiry date | Jun 19, 2038 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/80
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method and apparatus for maintaining a selected configuration for a structure. Metrology data for a support system is received while the support system holds the structure. A determination is made as to whether a current configuration of the structure is within selected tolerances of the selected configuration for the structure based on the metrology data. The support system is moved to move the structure held by the support system into the selected configuration in response to a determination that the current configuration of the structure is not within the selected tolerances of the selected configuration for the structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.