High precision wavelength measurement and control of a tunable laser
US10502632B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 15, 2017 |
| Grant date | Dec 10, 2019 |
| Priority date | — |
| Expiry date | Sep 20, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/0064
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A tunable laser system includes a tunable laser to be scanned over a range of frequencies and an interferometer having a plurality of interferometer outputs. At least two interferometer outputs of the plurality of interferometer outputs have a phase difference. A wavelength reference has a spectral feature within the range of frequencies, and the spectral feature does not change in an expected operating environment of the tunable laser. Processing circuitry uses the spectral feature and the plurality of interferometer outputs to produce an absolute measurement of a wavelength of the tunable laser and controls the tunable laser based on a comparison of the absolute measurement of the wavelength of the tunable laser with a setpoint wavelength.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.