Systems and methods for inspection and defect detection
US10502691B1 · kind B1 · utility
3Cited by
14References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 29, 2019 |
| Grant date | Dec 10, 2019 |
| Priority date | — |
| Expiry date | Mar 29, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of inspecting an article with a defect detection tool includes receiving one or more articles at an inspection station and inspecting one of the received one or more articles at the inspection station by evaluating the article for at least one physical defect with the defect detection tool. The defect detection tool includes a clear body including a surface element sized to correspond to the at least one physical defect in the article, and an inspection surface configured to contact a surface of the article.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.