Particulate matter measurement apparatus and method
US10502710B2 · kind B2 · utility
2Cited by
12References
27Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Jun 6, 2017 |
| Grant date | Dec 10, 2019 |
| Priority date | — |
| Expiry date | Jul 3, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N15/0606
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Particle measurement apparatus comprises an inlet for receiving a gas sample for analysis, a photoionisation chamber, at least one light source arranged to illuminate an interior of the photoionisation chamber, first and second electrodes coupled to a power source and configured to provide a DC potential difference across at least a portion of the photoionisation chamber, and an outlet, together defining a gas flow path from the inlet, through the photoionisation chamber, and towards the outlet.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.