Systems and methods for specimen inspection using ultrasonic wave generation
US10502715B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 25, 2017 |
| Grant date | Dec 10, 2019 |
| Priority date | — |
| Expiry date | Jun 12, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/106
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for specimen inspection using ultrasonic wave generation are disclosed herein. In one embodiment, an apparatus for inspecting a solid object using ultrasound includes: a pulser having pulser ports for outputting electrical signals. The apparatus also includes a switching array for receiving the signals from the pulser ports as individual channels, and routing the signals to individual elements of a transmitter array. The apparatus also includes the transmitter array, where each element of the transmitter array generates ultrasound in the solid object in response to the signal received from the switching array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.