Interferometry-based data redatuming and/or depth imaging
US10502850B2 · kind B2 · utility
1Cited by
2References
21Claims
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Key dates
| Filing date | Mar 26, 2013 |
| Grant date | Dec 10, 2019 |
| Priority date | — |
| Expiry date | Sep 3, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V1/345
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Processing measurements to create “reflectivity” data at a datum for a target using Joint Point-Spread Functions. The “reflectivity” data can be an image or an extended image. The methods can create single reflectivity data from measurements from multiple experiments, or multiple processed datasets via different processing routes from measurements from a single experiment, or measurements from a single experiment with multiple simultaneous sources.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.