Patent · US Active

Method for processing silicon material

US10505069B2 · kind B2 · utility

0Cited by
1References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 11, 2016
Grant dateDec 10, 2019
Priority date
Expiry dateSep 5, 2036

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P70/50

Abstract

The present disclosure provides a method for accelerating the formation of defects in doped silicon. A doped silicon area is exposed with high intensity electromagnetic radiation to provide a substantial excess of majority carriers and promote a high rate of defect formation to allow efficient silicon passivation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.