Patent · US Active

Reflectometry instrument and method for measuring macular pigment

US10506925B2 · kind B2 · utility

4Cited by
14References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 2, 2018
Grant dateDec 17, 2019
Priority date
Expiry dateMar 3, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J3/0218
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A reflectometry instrument includes a light source for emitting an illumination beam that illuminates the macula. A portion of the illumination beam is reflected from the macula and forms a detection beam. The detection beam is indicative of macular pigment in the macula. The instrument also includes a first mirror for reflecting the illumination beam toward the macula and for reflecting the detection beam from the macula. The instrument is configured so that the illumination beam and the detection beam remain separated between the macula and the first mirror.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.