Patent · US Active

Method for single-point scanning of a workpiece and coordinate measuring machine

US10508895B2 · kind B2 · utility

0Cited by

2References

24Claims

0Family size

Assignee

Carl Zeiss Industrielle Messtechnik GmbH · DE

Inventors

Guenter Grupp · Donzdorf, DE
Otto Ruck · Ellwangen (Jagst), DE
Eugen Aubele

Key dates

Filing date	Feb 21, 2017
Grant date	Dec 17, 2019
Priority date	—
Expiry date	Feb 28, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01B21/04
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present invention relates to a method for single-point probing of a workpiece by means of a sensor, in particular a tactile sensor, of a coordinate measuring machine, comprising the steps of providing a variable at least indirectly representing a required accuracy of the single-point probing, providing a parameter data set, wherein the parameter data set has prescriptions for regulating and/or evaluating the single-point probing with the required accuracy, and carrying out the single-point probing of the workpiece, wherein the coordinate measuring machine is regulated on the basis of the provided parameter data set and/or an evaluation is carried out on the basis of the provided parameter data set. Furthermore, a coordinate measuring machine for single-point probing of a workpiece is proposed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.