Patent · US Active

Transparent measuring probe for beam scanning

US10508950B2 · kind B2 · utility

0Cited by
2References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 29, 2016
Grant dateDec 17, 2019
Priority date
Expiry dateNov 29, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J2001/4261
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to a measuring probe for scanning light beams (10) or laser beams. The measuring probe is suitable for scanning laser beams with very high power and for determining geometric parameters of a light beam (10) with high spatial resolution. For this purpose, a device is proposed which comprises a body (20), a probe area (30) and a detector (40). The body (20) is made of an optically transparent material and has a light beam entry surface (22), a light beam exit surface (23) and a detection light exit surface (25). The light beam entry surface (22) and the light beam exit surface (23) are for the most part smooth and polished. The body (20) includes the probe area (30) having light-deflecting structuring. The detector (40) is designed to detect at least part of the beam portion (15) deflected from the light beam (10) by the probe area (30). The body (20) and the light beam (10) are movable in two different directions of movement (51, 52) perpendicular to the direction of the axis (11) of the light beam (10) relative to each other. The probe area (30) has a shape whose two-dimensional projection on a surface perpendicular to the axis (11) of the light beam (10) appr…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.