Transparent measuring probe for beam scanning
US10508950B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 29, 2016 |
| Grant date | Dec 17, 2019 |
| Priority date | — |
| Expiry date | Nov 29, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2001/4261
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a measuring probe for scanning light beams (10) or laser beams. The measuring probe is suitable for scanning laser beams with very high power and for determining geometric parameters of a light beam (10) with high spatial resolution. For this purpose, a device is proposed which comprises a body (20), a probe area (30) and a detector (40). The body (20) is made of an optically transparent material and has a light beam entry surface (22), a light beam exit surface (23) and a detection light exit surface (25). The light beam entry surface (22) and the light beam exit surface (23) are for the most part smooth and polished. The body (20) includes the probe area (30) having light-deflecting structuring. The detector (40) is designed to detect at least part of the beam portion (15) deflected from the light beam (10) by the probe area (30). The body (20) and the light beam (10) are movable in two different directions of movement (51, 52) perpendicular to the direction of the axis (11) of the light beam (10) relative to each other. The probe area (30) has a shape whose two-dimensional projection on a surface perpendicular to the axis (11) of the light beam (10) appr…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.