Patent · US Active

Distributed analysis x-ray inspection methods and systems

US10509142B2 · kind B2 · utility

3Cited by
689References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 15, 2019
Grant dateDec 17, 2019
Priority date
Expiry dateJan 15, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30248
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present specification discloses systems and methods for integrating manifest data for cargo and light vehicles with their X-ray images generated during scanning. Manifest data is automatically imported into the system for each shipment, and helps the security personnel to quickly determine the contents of cargo. In case of a mismatch between cargo contents shown by manifest data and the X-ray images, the cargo may be withheld for further inspection. In one embodiment, the process of analyzing the X-ray image of the cargo in conjunction with the manifest data is automated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.