Memory module test adapter
US10510432B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 25, 2017 |
| Grant date | Dec 17, 2019 |
| Priority date | — |
| Expiry date | Feb 23, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5602
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Approaches, techniques, and mechanisms are disclosed for a test adapter designed to improve testability of non-volatile dual in-line memory modules (NVDIMM) on automatic test equipment (ATE) testers or in-system boards, which have inadequate power supplies. An NVDIMM includes both volatile memories and non-volatile memories. A test adapter is designed to supply increased power to an NVDIMM. A test adapter is implemented using an interposer or a printed circuit board (PCB) that may be inserted into a socket on an ATE tester or on an end-user system-level board. The interposer or PCB includes a power socket for attaching a power cable to supply the external power supply to the NVDIMM. A power on/off sequence is controlled by an ATE tester to simulate or test a system power on/off sequence. An external input power is always on, but both serial and backup power signals are only on during tests of an NVDIMM.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.