Spectrometer including metasurface
US10514296B2 · kind B2 · utility
14Cited by
17References
21Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | Jul 27, 2016 |
| Grant date | Dec 24, 2019 |
| Priority date | — |
| Expiry date | Jul 27, 2036 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB82Y20/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectrometer includes a substrate; a slit which is provided on the substrate and through which light is incident onto the substrate; a metasurface including nanostructures that is configured to reflect and focus the light incident thereon through the slit, at different angles based on respective wavelengths; and a sensor which is provided on one side of the substrate that is opposite to another side of the substrate at which the metasurface is disposed, and configured to receive the light from the metasurface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.