Capacitance measuring circuit and capacitance measuring method
US10514403B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 4, 2017 |
| Grant date | Dec 24, 2019 |
| Priority date | — |
| Expiry date | Mar 12, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/044
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A circuit and method of measuring capacitance are disclosed. The capacitance measuring circuit includes an integrator circuit, a first control circuit, a second control circuit and a processor circuit. The capacitance measuring method includes steps of: using a current source and a charging/discharging time to generate a first charge amount related to a second charge amount of a capacitor to be detected; generating a third charge amount and generating a fourth charge amount according to the first charge amount and the third charge amount; generating a fifth charge amount and generating a remaining charge amount according to the fifth charge amount and fourth charge amount; using an integrator to convert the remaining charge amount into a first voltage and generating a judging result according to whether the first voltage meets a second voltage; and calculating the judging result to obtain a capacitance variation of the capacitor to be detected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.