Distributed test method applicable to system-level test of intelligent high voltage equipment
US10514407B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 22, 2016 |
| Grant date | Dec 24, 2019 |
| Priority date | — |
| Expiry date | Jun 4, 2038 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY04S40/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A distributed test method applicable to a system-level test of intelligent high voltage equipment. The method includes: firstly, carrying out unified modeling on test equipment behaviors according to test requirements, and generating a general test case for ensuring accuracy and coordination of test behaviors and test time sequences under various work conditions; then, extracting, according to a feature element of role defining, sequence states of same roles from the general test case, and recombining the sequence states according to an execution sequence so as to form test sub-cases of the roles; finally, executing, by each piece of test equipment, corresponding test sub-cases to achieve cooperative linkage by means of information interaction, so as to accomplish entire process simulation of the test conditions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.