Method and system for determining 3D object poses and landmark points using surface patches
US10515259B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 26, 2015 |
| Grant date | Dec 24, 2019 |
| Priority date | — |
| Expiry date | Feb 26, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30201
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system determine a three-dimensional (3D) pose of an object and 3D locations of landmark points of the object by first obtaining a 3D point cloud of the object. 3D surface patches are extracted from the 3D point cloud, and a parametric model is fitted to each 3D surface patch to determine a set of descriptors. A set of correspondences between the set of descriptors and a set of descriptors of patches extracted from 3D point clouds of objects from the same object class with known 3D poses and known 3D locations of landmark points is determined. Then, the 3D pose of the object and 3D locations of the landmark points of the object are estimated from the set of correspondences.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.