Reducing detector wear during calibration and tuning
US10515789B2 · kind B2 · utility
0Cited by
5References
19Claims
0Family size
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Key dates
| Filing date | Mar 13, 2018 |
| Grant date | Dec 24, 2019 |
| Priority date | — |
| Expiry date | Jul 13, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/4205
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method of operating a mass spectrometer comprising: detecting a first ion species using a first gain setting of a detector or a first emission current for a first mass-to-charge range; detecting a second ion species using a second gain setting of the detector or a second emission current for a second mass-to-charge range; and using the detected first and second ion species to calibrate the mass range of a mass analyzer of the mass spectrometer, to tune the resolution of the mass analyzer, or to tune an ion optic of the mass spectrometer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.