Patent · US Active

Methods and apparatuses for defect diagnosis in a mechanical system

US10520397B2 · kind B2 · utility

2Cited by
11References
32Claims
0Family size

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Key dates

Filing dateMay 31, 2012
Grant dateDec 31, 2019
Priority date
Expiry dateNov 27, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M99/008
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Multiple methods and corresponding apparatuses for efficient and reliable defect diagnosis in components of mechanical systems, are described. According to one aspect, multi-scale enveloping-order spectrogram is used to diagnose, or detect, defects in a moving component of a mechanical system. According to another aspect, defect identification and diagnosis in a motor is performed based on spectral characteristics of motor current envelope. According to yet another aspect, a logic rule model, employing classification of features associated with single- or multi-sensor data, is employed for diagnosis of defects in components of mechanical systems.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.