Methods and apparatuses for defect diagnosis in a mechanical system
US10520397B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | May 31, 2012 |
| Grant date | Dec 31, 2019 |
| Priority date | — |
| Expiry date | Nov 27, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M99/008
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Multiple methods and corresponding apparatuses for efficient and reliable defect diagnosis in components of mechanical systems, are described. According to one aspect, multi-scale enveloping-order spectrogram is used to diagnose, or detect, defects in a moving component of a mechanical system. According to another aspect, defect identification and diagnosis in a motor is performed based on spectral characteristics of motor current envelope. According to yet another aspect, a logic rule model, employing classification of features associated with single- or multi-sensor data, is employed for diagnosis of defects in components of mechanical systems.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.