Mixed style bias network for RF switch FET stacks
US10523195B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 2, 2018 |
| Grant date | Dec 31, 2019 |
| Priority date | — |
| Expiry date | Aug 2, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2217/0018
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Embodiments include a switch stack comprising ACS FETs and mixed-style gate resistor bias networks that mitigate the effects of high leakage current. By carefully selecting the number of ACS FETs in a sub-stack that uses a rung gate resistor bias network versus a sub-stack that uses a rail gate resistor bias network, as well as by selecting particularly useful values for the gate resistors in each bias network, a tradeoff can be achieved between adverse Vg offset and Q factor. The switch stack may be configured with rung-rail gate resistor bias networks, or with rung-rail-rung gate resistor bias networks. Other embodiments include mixed-style body resistor bias networks in switch stacks comprising non-ACS FETs. Some embodiments include one or more positive-logic FETs M1-Mn, series-coupled on at least one end to an “end-cap” FET M0 of a type that turns OFF when the applied VGS is essentially zero volts.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.