Patent · US Active

Apparatus and a method for predicting a future state of an electronic component

US10527668B2 · kind B2 · utility

0Cited by

11References

18Claims

0Family size

Assignee

Intel IP Corporation · US

Inventors

Leonhard Heiss · Holzkirchen, DE
Andreas Lachmann · Unterhaching, DE
Reiner Schwab · Hausham, DE

Key dates

Filing date	Jun 21, 2016
Grant date	Jan 7, 2020
Priority date	—
Expiry date	Jun 21, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/275
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An apparatus for predicting a future state of an electronic component is provided. The apparatus includes a measuring unit configured to measure a waveform of a signal related to the electronic component. Further, the apparatus includes a processing unit configured to calculate a predicted value of a characteristic of the electronic component based on a reliability model of the electronic component using the waveform of the signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.