Method for characterizing illumination of a target surface
US10531539B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 23, 2017 |
| Grant date | Jan 7, 2020 |
| Priority date | — |
| Expiry date | Feb 23, 2037 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02B20/40
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method (300) for measuring illumination by a lighting unit (10) of a target surface (50) within a lighting environment (100) includes the steps of: illuminating (320), with a light source (12) of the lighting unit, the target surface; detecting (330), with a light sensor (32), a light intensity for a plurality of locations of the target surface; detecting (340) parameter of the lighting environment; selecting (350), by a controller of the lighting unit, a subset of the plurality of light intensities based on the detected parameter of the lighting environment; and estimating (360), using the selected subset of light intensities, a lux of the target surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.