Method for correcting measured values of a sensor element
US10533980B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 13, 2012 |
| Grant date | Jan 14, 2020 |
| Priority date | — |
| Expiry date | Jul 2, 2035 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02T10/40
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measured value of a sensor element is obtained during repeatedly executed measuring periods for performing different measurements and for setting different operating states, the sensor element being electrically connected in a periodically alternating manner, in consecutive switching positions, in a predefined order, where at least one measurement for determining the measured value is performed repeatedly within a measuring period for determining individual values at predefined switching positions, the measured value being determined from the individual values. Using the switching position within the measuring period, the operating state of the sensor element preceding the individual measurement, and therefore, the influence of the preceding circuit configuration on the individual measured value, is known, and the individual values are correspondingly corrected. By correcting the individual values, the measured value determined from the individual values is also corrected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.