Calibration arrangement and a method for a microwave analyzing or measuring instrument
US10534061B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 4, 2016 |
| Grant date | Jan 14, 2020 |
| Priority date | — |
| Expiry date | Oct 28, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for calibration of an electronic instrument, such as a vector network analyzer, includes a number of calibrator connector elements for connection to the instrument, and a plate element including a plurality of calibration waveguide structures. The plate element has conductive surfaces, and the calibrator connector elements and conductive surfaces include periodic structures disposed with respect to each other such that gaps are formed between them. An interface enables interconnection of a waveguide of a calibrator connector element, a waveguide of the instrument, and a calibration waveguide structure. The apparatus includes a driving unit and controller for moving the plate element and/or the calibrator connector element to connect the calibrator connector element to different calibration waveguide structures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.