Patent · US Active

Marking method for the reject marking of test elements

US10535442B2 · kind B2 · utility

0Cited by
8References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 12, 2013
Grant dateJan 14, 2020
Priority date
Expiry dateFeb 20, 2034

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/53022
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The test elements are provided that are adapted to detect at least one analyte in a sample. At least some of the test elements are provided with a defect marking which contains information about defectiveness of the test elements. The test elements include at least one radiation-sensitive material. The test elements are exposed to at least one radiation, the radiation being adapted to induce marking in the form of at least one optically detectable change in the radiation-sensitive material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.