Patent · US Active

Test system and test method

US10536228B2 · kind B2 · utility

1Cited by

0References

18Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Corbett Rowell · Tseung Kwan O, CN
Benoit Derat · Munich, DE

Key dates

Filing date	Jan 11, 2018
Grant date	Jan 14, 2020
Priority date	—
Expiry date	Jan 11, 2038

Classification

Technology area (CPC H)Electricity
CPC primaryH04B17/103
WIPO fieldTelecommunications
WIPO sectorElectrical engineering

Abstract

A test system for testing a wireless device under test in a test chamber. The device under test may be located on a bottom of the test chamber, and a measurement antenna may be mounted on a bottom or a side wall of the test chamber. Further, a reflector may be mounted on a ceiling of the test chamber. Accordingly, a signal path for testing the device under test may be established by reflecting the wireless signals between the device under test and the measurement antenna by the reflector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.