Dual-view probe for illumination and imaging, and use thereof
US10536617B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 4, 2015 |
| Grant date | Jan 14, 2020 |
| Priority date | — |
| Expiry date | Jul 18, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/555
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
One embodiment of the invention is directed to an imaging probe which comprises a first element supplying electromagnetic radiation in a forward path for illuminating a forward field of view of space in front of the probe, a second element supplying electromagnetic radiation in a sideways and/or rearward path for illuminating a sideways and/or back field of view of space alongside the probe and an image sensor. The probe further includes an imaging device in imaging paths imaging the forward and sideways and/or back fields of view onto the image sensor. Preferably the forward path, the sideways and/or rearward path and the imaging paths are unobstructed by any component of the probe. Preferably the forward and sideways and/or back fields of view are registered in a fixed spatial relationship relative to one another on the image sensor. This probe can also be used with existing endoscopes or laparoscopes so that it will be easily merged into current instruments of different manufacturers, making it easier and cheaper to use this product without the expense of a totally new endoscopy or laparoscope platform. This probe can also be used to image objects in inanimate environments as we…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.