Patent · US Active

Computed tomographic system calibration

US10539515B2 · kind B2 · utility

6Cited by

1References

20Claims

0Family size

Assignee

GE Inspection Technologies, LP · US

Inventors

Andreas Fischer · Castro Valley, US
Nils Rothe · Hürth, DE
Alexander Suppes · Garbsen, DE
Eugen Trapet · Braunschweig, DE

Key dates

Filing date	Mar 30, 2018
Grant date	Jan 21, 2020
Priority date	—
Expiry date	Jul 27, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01N2223/419
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Method and apparatus are provided for calibration or verification of accuracy specification of a computed tomographic system. In one embodiment, the apparatus can include a base structure, a first set of test objects arranged along a first axis and coupled to the base structure, and a second set of test objects arranged along a second axis and coupled to the base structure. The first set of test objects and the second set of test objects have a first geometry. The apparatus can also include a third set of test objects and a fourth set of test objects. The third set of test objects, and the fourth set of test objects have a second geometry different from the first geometry. Locations of the first, second third and fourth set of test objects are spatially fixed with respect to the base structure. The apparatus is a test specimen adapted for calibration or accuracy verification of computed tomography system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.