Patent · US Active

Method of converting high-level test specification language to low-level test implementation language

US10539609B2 · kind B2 · utility

0Cited by

1References

16Claims

0Family size

Assignee

NXP USA, Inc. · US

Inventors

Arthur Freitas · Toulouse, FR
Cedric Fau · Toulouse, FR
Cedric Labouesse · Aucamville, FR
Philippe Soleil · Aureville, FR
Pascal Sandrez · Toulouse, FR

Key dates

Filing date	May 8, 2015
Grant date	Jan 21, 2020
Priority date	—
Expiry date	Nov 19, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2834
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method comprising: recording test code defined in a high-level test specification language; and automated analysis of the test code defined in the high-level test specification language before a conversion of the high-level test specification language to a low-level test implementation language configured to enable testing of a target by a test module.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.