Image feature alignment
US10540758B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 13, 2015 |
| Grant date | Jan 21, 2020 |
| Priority date | — |
| Expiry date | Nov 13, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30161
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Image feature alignment is provided. In some implementations, a computer-readable tangible medium includes instructions that direct a processor to access a reference feature point associated with a high contrast region in a first sub-image that is associated with a first section of a borehole. Instructions are also present that direct the processor to identify several candidate feature points in a second sub-image associated with a second section of the borehole adjacent to the first section of the borehole, with each of the candidate feature points being believed to possibly be associated with the high contrast region. Additional instructions are present that direct the processor to prune the candidate feature points using global solution pruning to arrive at a matching candidate feature point in the second sub-image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.