Patent · US Active

CMM probe path controller and method

US10545019B2 · kind B2 · utility

1Cited by

6References

23Claims

0Family size

Assignee

Hexagon Metrology, Inc. · US

Inventors

Paul Racine · Providence, US
Scott Carlson · Cheseaux, CH

Key dates

Filing date	Apr 14, 2015
Grant date	Jan 28, 2020
Priority date	—
Expiry date	Oct 7, 2036

Classification

Technology area (CPC G)Physics
CPC primaryG05B2219/37452
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and apparatus for measuring an object using a CMM receives nominal geometry data relating to the object, and produces a set-up path based on the received nominal geometry data. The method also conducts a set-up measurement of the object using a CMM probe. The CMM probe conducts the set-up measurement by following the set-up path, and the set-up measurement of the object produces scan path information. The method generates a scan path using the scan path information, and controls the CMM probe to conduct a fine measurement of the object by causing the CMM probe to move along the generated scan path.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.