Virtual autocalibration of sensors
US10545784B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 6, 2018 |
| Grant date | Jan 28, 2020 |
| Priority date | — |
| Expiry date | Nov 6, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30161
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure describes methods and systems for virtually calibrating geometric sensors with overlapping fields of view. In some embodiments, a geometric sensor may be virtually calibrated by applying a correction value to profile data obtained by the geometric sensor to generate adjusted profile data. The correction factor may be determined based at least in part on X-Y offsets and/or rotational offsets of prior profile data obtained by the geometric sensor relative to corresponding profile data obtained by a reference geometric sensor, and may be recalculated or updated as new sets of profile data are obtained. The adjusted profile data may be used in place of the original profile data in various data processing operations to functionally offset a positional error of the geometric sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.