Patent · US Active

Method and system for identifying potential causes of failure in simulation runs using machine learning

US10546080B1 · kind B1 · utility

2Cited by
0References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 27, 2018
Grant dateJan 28, 2020
Priority date—
Expiry dateDec 27, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06N5/01
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for identifying a potential cause of a failure in simulation runs on a design under test (DUT) using machine learning is disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.