Patent · US Active

Global analysis peak fitting for chemical spectroscopy data

US10551247B1 · kind B1 · utility

2Cited by
12References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 28, 2016
Grant dateFeb 4, 2020
Priority date
Expiry dateJun 17, 2036

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N23/085
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention relates to methods for analyzing a chemical sample. For instance, the methods herein allow for global analysis of spectroscopy data in order to extract useful chemical properties from complicated multidimensional data. Such analysis can optionally employ data compression to further expedite computer-implemented computation. In particular, the methods herein provide global analysis of data matrices explained by both linear and non-linear terms.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.