Batch authentication of materials for automated anti counterfeiting
US10551524B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 7, 2015 |
| Grant date | Feb 4, 2020 |
| Priority date | — |
| Expiry date | Apr 16, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/56
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for authenticating material samples are provided. Characteristic features are measured for a batch of material samples that comprise substantially the same composition and are produced by substantially the same process. The measured characteristic features have respective variability that is analyzed to extract statistical parameters. In some cases, reference ranges are determined based on the extracted statistical parameters for the batch of material samples. The corresponding statistical parameters of a test material sample are compared to the reference ranges to verify whether the test material sample is authentic.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.