Method, system, and device for learned invariant feature transform for computer images
US10552709B2 · kind B2 · utility
3Cited by
6References
16Claims
0Family size
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Key dates
| Filing date | Jun 29, 2017 |
| Grant date | Feb 4, 2020 |
| Priority date | — |
| Expiry date | Oct 20, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20084
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for training a feature detector of an image processing device, including the steps of detecting features in the image to generate a score map, computing a center of mass on the score map to generate a location, extracting a patch from the image at the location by a first spatial transformer, estimating an orientation of the patch, rotating the patch in accordance with the patch orientation with a second spatial transformer, and describing the rotated patch to create a description vector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.