Thin film strain gauge
US10557760B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 22, 2019 |
| Grant date | Feb 11, 2020 |
| Priority date | — |
| Expiry date | Jul 22, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01L9/0055
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A strain gauge includes: a substrate; a dielectric layer on the substrate; a thin film electrical circuit on the dielectric layer and having input/output terminals; another layer disposed on the electrical circuit; the dielectric layer forming a first seal on one side of the electrical circuit, the another layer forming a second seal on a second side of the electrical circuit, the first and second seals having structure such that: in a first instance prior to exposure of the strain gauge to an autoclave cycle, the electrical circuit is productive of a first output voltage in response to a first input voltage; and in a second instance subsequent to exposure of the strain gauge to at least 10 autoclave cycles, the electrical circuit is productive of a second output voltage in response to a second input voltage, the first and second input voltages being equal, and the first and second output voltages being equal within a 15% shift in zero offset.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.