Methods and systems for testing components of parallel computing devices
US10558539B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 28, 2017 |
| Grant date | Feb 11, 2020 |
| Priority date | — |
| Expiry date | Mar 26, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/0739
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods are provided for testing a first computer device of a vehicle. A method includes selecting an operational component of the first computer device and selecting a test operation that is configured to utilize an entire capacity of the operational component. The method further includes instructing the first computer device to perform the test operation and to generate a first result. The method further yet includes retrieving a second result of the test operation and comparing the first result of the test operation from the first computer device with the second result. The method further yet includes indicating that the first computer device is faulty based at least in part on a difference between the first result and the second result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.