Dual-sensor arrangment for inspecting slab of material
US10563975B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 25, 2018 |
| Grant date | Feb 18, 2020 |
| Priority date | — |
| Expiry date | Jul 25, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/70
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to an aspect of one or more embodiments, the present subject matter describes an apparatus for inspecting a slab of a material. The apparatus comprises a first and second low-coherence sensor configured to irradiate a first and second side of a slab of material with first light having a first polarization and second light having a second polarization, and thereafter configured to detect a reflection. A first polarizer is configured to allow reflected first light having the first polarization to pass through, and reject a second-light cross-talk portion having the second polarization. A second polarizer is configured to allow reflected second light having the second polarization to pass through, and reject a first-light cross-talk portion having the first polarization. Further, a computing-system is configured to receive signals representing the reflected first light and the reflected second light; and analyze the reflected first light and the reflected second light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.