Systems and methods for testing conductive microwire
US10564208B1 · kind B1 · utility
2Cited by
2References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 12, 2016 |
| Grant date | Feb 18, 2020 |
| Priority date | — |
| Expiry date | Aug 12, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K9/0081
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for testing the quality of a conductor is disclosed. Specifically, a system of testing a conductor using voltage source generator that is capacitively-coupled through the conductor to voltage detector is disclosed. The voltage source generates a varying voltage signal which induces a voltage signal in the capacitively coupled microwire conductor. The voltage detector that is also capacitively-coupled to the conductor measures the induced voltage. Using the detected voltage signal, the voltage detector determines whether there are any conductive breaks in the conductor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.