Patent · US Active

Composite substrate and thickness-tendency estimating method for piezoelectric substrate

US10566518B2 · kind B2 · utility

0Cited by
1References
6Claims
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Assignee

Inventors

Key dates

Filing dateFeb 27, 2017
Grant dateFeb 18, 2020
Priority date
Expiry dateMar 16, 2038

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03H9/02614
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A composite substrate according to the present invention includes a support substrate having a diameter of 2 inches or more, and a piezoelectric substrate having a thickness of 20 μm or less and bonded to the support substrate to transmit light. The piezoelectric substrate has a thickness distribution shaped like a fringe. A waveform having an amplitude within a range of 5 to 100 nm in a thickness direction and a pitch within a range of 0.5 to 20 mm in a width direction appears in the thickness distribution of the piezoelectric substrate in a cross section of the composite substrate taken along a line orthogonal to the fringe, and the pitch of the waveform correlates with a width of the fringe. In the piezoelectric substrate, the fringe may include either parallel fringes or spiral or concentric fringes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.