Methods and apparatus for implementing over-temperature fault protection in wearable devices and other electronic devices
US10566783B2 · kind B2 · utility
2Cited by
10References
17Claims
0Family size
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Key dates
| Filing date | Apr 11, 2017 |
| Grant date | Feb 18, 2020 |
| Priority date | — |
| Expiry date | Feb 5, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F5/01
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Implementing over-temperature fault protection in wearable devices and other electronic devices may be performed using an example apparatus including a voltage source; a thermistor bias network to, when enabled, output a thermistor voltage; an over-temperature determiner to enable the thermistor bias network; and, when the thermistor voltage corresponds to a temperature above a maximum temperature threshold, output a fault; and an isolation transistor to couple the voltage source to a system; and when the over-temperature determiner outputs the fault, decouple the voltage source from the system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.