Patent · US Active

Method for adjusting a measuring device

US10571391B2 · kind B2 · utility

0Cited by

5References

2Claims

0Family size

Assignee

Endress+Hauser Conducta GmbH+Co. KG · DE

Inventors

Frank Müller · Birkenfeld, DE
Peter Lindmuller · Oberkochen, DE
Daniel Iten · Uster, CH

Key dates

Filing date	Nov 21, 2017
Grant date	Feb 25, 2020
Priority date	—
Expiry date	Dec 22, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG01N2201/127
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present application relates to a method for adjusting a measuring device for measuring a measurand of a medium using at least one measuring sensor, including: laboratory calibration of the measuring device in a calibration solution, laboratory calibration of the measuring device in air, determination of a correction factor for correcting the laboratory calibration value of the measuring device in air to the laboratory calibration value of the measuring device in the calibration solution, on-site calibration of the measuring device in air, using the correction factor to correct the on-site calibration value of the measuring device in air, and on-site adjustment of the measuring device using the corrected on-site calibration value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.