Method for determining a reliability parameter of a new technical system
US10572610B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 23, 2016 |
| Grant date | Feb 25, 2020 |
| Priority date | — |
| Expiry date | Nov 7, 2037 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/02
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for determining a reliability parameter of a new technical system based on assigned failure parameters of m known technical systems is provided, wherein the new technical system comprises n1 devices of a first type, n2 devices of a second type, . . . , and nk devices of a k-th type; an i-th known technical system out of the m known technical systems, with 1≤i≤m, has an assigned failure parameter pi and comprises ni1 devices of the first type, ni2 devices of the second type, . . . , and nik devices of the k-th type; and individual failure information relating to the devices of the first to k-th type is initially unknown.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.