Sensor for measuring reflected light for optimizing deposited performance enhancement coatings on substrates
US10574180B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 15, 2016 |
| Grant date | Feb 25, 2020 |
| Priority date | — |
| Expiry date | May 15, 2036 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E10/50
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An innovative portable reflected light sensor for non-destructively measuring characteristics of performance enhancement coatings applied to substrates such as solar photovoltaic panels is described. The innovative portable sensor provides a light source and a photodetector for measuring light incident on a substrate surface from the light source, and reflected to the photodetector. The spot size of the illuminated region of the substrate is at least 1 cm2 in area, thus averaging over a relatively wide portion of the substrate surface relative to existing fiber optic devices. A single measurement may then be representative of the coating. The innovative portable reflected light sensor is adapted to measure substrates in the field, and is especially adapted for assessing coating quality during the coating process. The innovative sensor also comprises a signal processing circuit that performs analysis of the measurements and feeds back status of the coating to the operator for coating process control.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.