Increased spatial resolution for photon-counting edge-on x-ray detectors
US10575800B2 · kind B2 · utility
1Cited by
10References
20Claims
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Key dates
| Filing date | Mar 8, 2017 |
| Grant date | Mar 3, 2020 |
| Priority date | — |
| Expiry date | Jun 5, 2038 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/502
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
There is provided a method and an arrangement for determining a position of interaction of a photon in an individual detector diode of a photon-counting x-ray detector. The method includes determining the position of interaction in the detector diode based on pulse characteristics of a pulse generated by the individual detector diode in response to the photon interaction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.