Patent · US Active

Compact wavelength meter and laser output measurement device

US10578494B1 · kind B1 · utility

3Cited by
1References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 9, 2018
Grant dateMar 3, 2020
Priority date—
Expiry dateMar 4, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J2009/0288
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus includes a photonic integrated circuit (PIC) to measure an optical wavelength of a light source. The PIC includes an optical splitter, a plurality of tunable interferometers and one or more detectors. The optical splitter is coupled to the light source, and the interferometers are coupled to the optical splitter. Each interferometer receives a portion of an optical signal of the light source. One or more detectors are coupled to each interferometer, and the interferometers have different free spectral ranges (FSRs). A largest FSR value of the different FSRs is greater than an entire intended wavelength measurement range of the PIC.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.