Sequence pattern characterization
US10578758B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 4, 2016 |
| Grant date | Mar 3, 2020 |
| Priority date | — |
| Expiry date | Dec 14, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2218/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method, including: obtaining a scale-depth or scale-time phase image of a continuous wavelet transform of an input signal, the scale-depth or scale-time phase image including oval-shaped circular patterns observed on the mirrored phase image; and extracting, with a computer, hierarchical multiscale intervals from the scale-depth or scale-time phase image, wherein the hierarchical multiscale intervals correspond to the oval-shaped circular patterns observed on the mirrored scale-depth or scale-time phase image of the continuous wavelet transform of the input signal. Another method includes: characterizing, with a computer, curve shapes of intervals of a signal using beta distribution; and visualizing and analyzing, with the computer, shape parameters of the curve shapes on a shape-parameter crossplot.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.