Systems and methods for enhanced ToF resolution
US10585173B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 9, 2019 |
| Grant date | Mar 10, 2020 |
| Priority date | — |
| Expiry date | Apr 9, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/894
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for projecting and detecting light are disclosed. Systems and methods for determining surface depth information using Time-of-Flight (“ToF”) detectors configured to measure time-of-flight in connection with flood light reflections, structured light reflections, and/or a fusion of both (e.g., in a selective, controlled, and/or patterned manner) are disclosed. Some portions of this disclosure also relate to embodiments of the technology configured for operation in connection with a switchable diffuser.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.